AN ELECTRONIC SPECKLE PATTERN INTERFEROMETER FOR COMPLETE INPLANE DISPLACEMENT MEASUREMENT

Measurement of plane-strain surface displacement with ESPI requires at least two in-plane illumination geometries. For static loading conditions it is acceptable to record these two interferograms sequentially. However, for time-dependent strain fields, it is necessary to use both illumination geometries simultaneously so that a recording is made with identical strain conditions existing for both. The authors describe a new interferometer that has been devised to measure two in-plane interferograms at the same time. The determination of the method of operation and experimental verification of the technique are given.