ELASTIC-CONSTANT AND STRAIN MEASUREMENTS USING A THREE BEAM SPECKLE PATTERN INTERFEROMETER

被引：14

作者：

JONES, R ^{[1
]}

LEENDERTZ, JA ^{[1
]}

机构：

[1] UNIV TECHNOL, DEPT MECH ENGN LOUGHBOROUGH, LOUGHBOROUGH, LEICESTERSHIRE, ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1974年 / 7卷 / 08期

关键词：

D O I：

10.1088/0022-3735/7/8/020

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：653 / 657

页数：5

共 9 条

[1] NEW THEORY FOR PRACTICAL INTERPRETATION OF HOLOGRAPHIC INTERFERENCE PATTERNS RESULTING FROM STATIC SURFACE DISPLACEMENTS
BIJL, D
JONES, R
[J]. OPTICA ACTA, 1974, 21 (02): : 105 - 118
[2] BIJL D, 1970, P INT S HOLOGRAPHY A
[3] HOLOGRAPHIC AND VIDEO TECHNIQUES APPLIED TO ENGINEERING MEASUREMENT
BUTTERS, JN
LEENDERTZ, JA
[J]. MEASUREMENT AND CONTROL, 1971, 4 (12): : 349 - +
[4] BUTTERS JN, 1971, J PHYS E, V4, P272
[5] WHITE-LIGHT PROJECTION TECHNIQUE FOR VIEWING DOUBLE-EXPOSURE SPECKLE INTERFEROGRAMS
JONES, R
LEENDERTZ, JA
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08): : 616 - 616
[6] JONES R, 1972, THESIS U BRADFORD
[7] LEENDERTZ JA, 1970, J PHYS E, V4, P272
[8] NYE JF, 1969, PHYSICAL PROPERTIES
[9] TANNER LM, 1968, J PHYS E, V7, P517