CONTRAST IN THE ELECTRON SPECTROSCOPIC IMAGING MODE OF A TEM .3. BRAGG CONTRAST OF CRYSTALLINE SPECIMENS

被引：25

作者：

BAKENFELDER, A

FROMM, I

REIMER, L

RENNEKAMP, R

机构：

[1] Physikalisches Institut, Universität Münster, Münster, D-4400

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1990年 / 159卷

关键词：

Bragg contrast; chromatic aberration; Electron spectroscopic imaging; high‐voltage electron microscopy; maximum useful thickness; plasmon‐loss filtering; preservation of Bragg contrast; thickness and bend contours; zero‐loss filtering;

D O I：

10.1111/j.1365-2818.1990.tb04773.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An energy‐filtering microscope working at 80 keV is used for the investigation of the effect of inelastic scattering on Bragg contrast. Inelastic scattering results in a preservation of Bragg contrast but edge and bend contours are blurred by a spectrum of excitation errors due to the angular distribution of inelastic scattering. This blurring and the chromatic aberration results in a decrease of contrast and resolution for thick specimens. Therefore, contrast and resolution can be increased by zero‐loss filtering as shown by evaporated films of increasing thickness below 150 μg/cm2. Up to ∼300 μg/cm2 an energy‐filtered image at the most probable energy shows the best results. The results obtained are extrapolated to energy‐filtered high‐voltage electron microscopy. 1990 Blackwell Science Ltd

引用

页码：161 / 177

页数：17

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