NUCLEAR-REACTIONS IN SEMICONDUCTORS

被引：34

作者：

PETERSEN, EL

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1980年 / 27卷 / 06期

关键词：

D O I：

10.1109/TNS.1980.4331058

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1494 / 1499

页数：6

共 12 条

[1]

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BRADFORD, JN .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (01) :942-947

[3] SINGLE EVENT UPSETS IN RAMS INDUCED BY PROTONS AT 4.2 GEV AND PROTONS AND NEUTRONS BELOW 100 MEV [J].

GUENZER, CS ;

ALLAS, RG ;

CAMPBELL, AB ;

KIDD, JM ;

PETERSEN, EL ;

SEEMAN, N ;

WOLICKI, EA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1485-1489

[4]

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[5]

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[6] COSMIC-RAY-INDUCED ERRORS IN MOS DEVICES [J].

PICKEL, JC ;

BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (02) :1006-1015

[7] CORRECTION [J].

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[8]

Williamson C.F., 1966, TABLES RANGE STOPPIN

[9] SOFT ERRORS INDUCED BY ENERGETIC PROTONS [J].

WYATT, RC ;

MCNULTY, PJ ;

TOUMBAS, P ;

ROTHWELL, PL ;

FILZ, RC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :4905-4910

[10]

Ziegler J. F, 1977, STOPPING RANGES IONS, V4

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