MICROFACETING IN A TUNGSTEN INCOHERENT TWIN BOUNDARY

被引：2

作者：

EATON, HC

BAYUZICK, RJ

机构：

[1] LOUISIANA STATE UNIV,DEPT MECH ENGN,BATON ROUGE,LA 70803

[2] VANDERBILT UNIV,DEPT MAT SCI,NASHVILLE,TN 37235

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 03期

关键词：

D O I：

10.1063/1.326156

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Experiments are described in which the field-ion microscope is used to observe the details of grain-boundary migration in polycrystalline tungsten. Annealing is done in situ and the specimen is observed prior to and after several heating pulses. Microfacets are formed during the process which after analysis are observed to differ from those expected when the coincidence site lattice model is assumed to be valid.

引用

页码：1267 / 1272

页数：6

共 12 条

[1]

[Anonymous], 2012, CRYSTAL DEFECTS CRYS

[2]

BARRETT CS, 1952, STRUCTURE METALS, P26

[3] OBSERVATIONS OF GRAIN BOUNDARIES WITH FIELD ION MICROSCOPE [J].