RELATIVE SENSITIVITY FACTORS IN GLOW-DISCHARGE MASS-SPECTROMETRY

被引:142
作者
VIETH, W
HUNEKE, JC
机构
[1] Charles Evans and Associates, Redwood City, CA 94063
关键词
D O I
10.1016/0584-8547(91)80017-W
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Relative sensitivity factors for the analysis of 56 elements by glow discharge mass spectrometry have been determined from the multiple analyses of 30 standard reference materials representing six different matrix elements. The measurements were made using the VG 9000 GDMS instrument. Statistical evaluation of the data demonstrates the precision and accuracy of elemental analysis by high mass resolution GDMS and confirms that RSF values are independent of matrix. A semi-empirical model for estimating RSF values in GDMS is also presented. Estimated RSFs are obtained taking into account diffusion, ionization/recombination and ion extraction phenomena. Good agreement between experimentally determined and estimated RSF values is observed in most cases.
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页码:137 / 153
页数:17
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