EVALUATION OF REFLECTION INTENSITIES FOR THE COMPONENTS OF MULTIPLE LAUE DIFFRACTION SPOTS .2. USING THE WAVELENGTH-NORMALIZATION CURVE

被引:27
作者
CAMPBELL, JW [1 ]
HAO, Q [1 ]
机构
[1] UNIV LIVERPOOL,LIVERPOOL L69 3BX,ENGLAND
来源
ACTA CRYSTALLOGRAPHICA SECTION A | 1993年 / 49卷
关键词
D O I
10.1107/S0108767393007251
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
In a Laue diffraction pattern, 10-20% of the spots result from the exact superposition of two or more reflections that are 'harmonics', e.g. hkl, 2h,2k,2l etc. The use of only the 80-90% of the reflections measurable as singles may not always be sufficient and evaluation of the intensities of the components of the multiple spots is therefore important. A procedure for this deconvolution is given, based on the varying nature of the wavelength-normalization curve. A feasibility trial has been carried out using a single Laue diffraction image of tetragonal hen egg white lysozyme (HEWL) recorded on an image plate. This allowed the intensities of 103 reflections to be evaluated from multiple spots. For these reflections, their agreement with monochromatic diffractometer data gave an R factor of 0.157 for 96 common reflections. An earlier paper described another procedure based on direct methods, which addressed the same problem.
引用
收藏
页码:889 / 893
页数:5
相关论文
共 11 条
  • [1] ACCURACY IN LAUE X-RAY-DIFFRACTION ANALYSIS OF PROTEIN STRUCTURES
    BARTUNIK, HD
    BARTSCH, HH
    HUANG, QC
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 180 - 188
  • [2] CAMPBELL JW, 1987, BIOPHYSICS SYNCHROTR, P53
  • [3] MULTIPLICITY DISTRIBUTION OF REFLECTIONS IN LAUE DIFFRACTION
    CRUICKSHANK, DWJ
    HELLIWELL, JR
    MOFFAT, K
    [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1987, 43 : 656 - 674
  • [4] TIME-RESOLVED DIFFRACTION STUDIES ON GLYCOGEN PHOSPHORYLASE-B
    DUKE, EMH
    HADFIELD, A
    WALTERS, S
    WAKATSUKI, S
    BRYAN, RK
    JOHNSON, LN
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1992, 340 (1657): : 245 - 261
  • [5] EVALUATION OF REFLECTION INTENSITIES FOR THE COMPONENTS OF MULTIPLE LAUE DIFFRACTION SPOTS BY DIRECT-METHODS
    HAO, Q
    CAMPBELL, JW
    HARDING, MM
    HELLIWELL, JR
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1993, 49 : 528 - 531
  • [6] THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS
    HELLIWELL, JR
    HABASH, J
    CRUICKSHANK, DWJ
    HARDING, MM
    GREENHOUGH, TJ
    CAMPBELL, JW
    CLIFTON, IJ
    ELDER, M
    MACHIN, PA
    PAPIZ, MZ
    ZUREK, S
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 : 483 - 497
  • [7] Helliwell JR., 1992, MACROMOLECULAR CRYST
  • [8] TEMPLE B, 1987, COMPUTATIONAL ASPECT, P84
  • [9] TEMPLE BRS, 1989, THESIS CORNELL U ITH
  • [10] COMPARISON OF RADIATION-INDUCED DECAY AND STRUCTURE REFINEMENT FROM X-RAY DATA COLLECTED FROM LYSOZYME CRYSTALS AT LOW AND AMBIENT-TEMPERATURES
    YOUNG, ACM
    DEWAN, JC
    NAVE, C
    TILTON, RF
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 : 309 - 319