ANOMALOUS PHOTOEMISSION UNDER THE INFLUENCE OF A CHARGED SUBSTANCE IN LOW-FREQUENCY PARALLEL-PLATES DISCHARGE IN N2 GAS

被引：1

作者：

SUGANOMATA, S

ISHIKAWA, I

TANAKA, J

机构：

[1] Yamanashi University, Kofu

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 07期

关键词：

ANOMALOUS PHOTOEMISSION; N2 337.1 NM LINE; N2+ 391.4 NM LINE; LOW-FREQUENCY DISCHARGE; N2; GAS; CHARGED WAFER OR FILM;

D O I：

10.1143/JJAP.31.2263

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Emissions at N2 337.1 and N2+ 391.4 nm lines were observed near a charged-substance-like wafer or film attached to one of two electrodes which was changing from the temporary cathode to the anode under an applied voltage at frequencies from 1 to 20 kHz. The temporal variation of the floating potential was investigated by the relationship of photoemission to the discharge current at pressures from 0.1 to 0.4 Torr.

引用

页码：2263 / 2264

页数：2

共 3 条

[1]

ISHIKAWA I, 1989, 19TH P INT C PHEN IO, P404

[2] BOLTZMANN-EQUATION ANALYSIS OF ELECTRON SWARM BEHAVIOR IN NITROGEN [J].