DEPTH OF INFORMATION IN PHOTO-ELECTRON MICROSCOPY

被引：20

作者：

HOULE, WA

ENGEL, W

WILLIG, F

REMPFER, GF

GRIFFITH, OH

机构：

[1] MAX PLANCK GESELL,FRITZ HABER INST,D-1000 BERLIN 33,FED REP GER

[2] PORTLAND STATE UNIV,DEPT PHYS,PORTLAND,OR 97207

[3] UNIV OREGON,DEPT CHEM,EUGENE,OR 97403

来源：

ULTRAMICROSCOPY | 1982年 / 7卷 / 04期

关键词：

D O I：

10.1016/0304-3991(82)90261-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：371 / 380

页数：10

共 36 条

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[9]

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[10] PHOTOELECTRON MICROSCOPY OF ORGANIC SURFACES - EFFECT OF SUBSTRATE REFLECTIVITY [J].

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