BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .1. MONTE-CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALS

被引:284
作者
ICHIMURA, S
SHIMIZU, R
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D O I
10.1016/0039-6028(81)90382-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:386 / 408
页数:23
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共 39 条
[1]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[2]   ANALYTICAL EXPRESSIONS FOR POTENTIALS OF NEUTRAL THOMAS-FERMI-DIRAC ATOMS AND FOR CORRESPONDING ATOMIC SCATTERING FACTORS FOR X RAYS AND ELECTRONS [J].
BONHAM, RA ;
STRAND, TG .
JOURNAL OF CHEMICAL PHYSICS, 1963, 39 (09) :2200-&
[3]   POLARIZATION BY MERCURY OF 100 TO 2000 EV ELECTRONS [J].
BUNYAN, PJ ;
SCHONFELDER, JL .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (545P) :455-+
[4]   GENERAL FORMALISM FOR QUANTITATIVE AUGER ANALYSIS [J].
CHANG, CC .
SURFACE SCIENCE, 1975, 48 (01) :9-21
[5]  
CHANG CC, 1974, CHARACTERIZATION SOL, pCH2
[6]  
DAVIS LE, 1976, HDB AUGER ELECTRON S
[7]   MONTE-CARLO CALCULATION OF THE SECONDARY-ELECTRON EMISSION OF NORMAL METALS .1. MODEL [J].
GANACHAUD, JP ;
CAILLER, M .
SURFACE SCIENCE, 1979, 83 (02) :498-518
[8]   TOTAL ELECTRON-IMPACT IONIZATION CROSS-SECTIONS OF K SHELLS OF SURFACE ATOMS [J].
GERLACH, RL ;
DUCHARME, AR .
SURFACE SCIENCE, 1972, 32 (02) :329-&
[9]  
GERLACH RL, 1976, SCANNING ELECTRON MI, P200
[10]   AUGER AND SECONDARY ELECTRONS EXCITED BY BACKSCATTERED ELECTRONS - APPROACH TO QUANTITATIVE-ANALYSIS [J].
GOTO, K ;
ISHIKAWA, K ;
KOSHIKAWA, T ;
SHIMIZU, R .
SURFACE SCIENCE, 1975, 47 (02) :477-494