BACKSCATTERING CORRECTION FOR QUANTITATIVE AUGER ANALYSIS .1. MONTE-CARLO CALCULATIONS OF BACKSCATTERING FACTORS FOR STANDARD MATERIALS

被引:284
作者
ICHIMURA, S
SHIMIZU, R
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D O I
10.1016/0039-6028(81)90382-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:386 / 408
页数:23
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共 39 条
[21]   BACKSCATTERING FACTOR IN AUGER-ELECTRON SPECTROSCOPY [J].
JABLONSKI, A .
SURFACE SCIENCE, 1979, 87 (02) :539-548
[22]  
KREFTING ER, 1973, QUANTITATIVE ANAL EL, P114
[23]  
MOGAMI A, 1976, 6TH P EUR C EL MICR, P422
[24]   THEORY OF MULTIPLE SCATTERING - 2ND BORN APPROXIMATION AND CORRECTIONS TO MOLIERE WORK [J].
NIGAM, BP ;
SUNDARESAN, MK ;
WU, TY .
PHYSICAL REVIEW, 1959, 115 (03) :491-502
[25]  
PALMBERG PW, 1973, ANAL CHEM, V45, pA549
[26]  
POWELL CJ, 1978, QUANTITATIVE SURFACE, pCH5
[27]   X-RAY CONTINUUM FROM THICK ELEMENTAL TARGETS FOR 10-50-KEV ELECTRONS [J].
RAOSAHIB, TS ;
WITTRY, DB .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) :5060-5068
[28]  
REIMER L, 1976, NBS SPEC PUBL, V460, P45
[29]  
Reuter W., 1972, 6 INT C XRAY OPT MIC, P121
[30]  
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103