ATOMIC POINT-CONTACT IMAGING

被引：28

作者：

SMITH, DPE

BINNIG, G

QUATE, CF

机构：

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 18期

关键词：

D O I：

10.1063/1.97403

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1166 / 1168

页数：3

共 9 条

[1]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[3] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J].

BRYANT, A ;

SMITH, DPE ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1986, 48 (13) :832-834

[4] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J].

GOLOVCHENKO, JA .

SCIENCE, 1986, 232 (4746) :48-53

[5]

PETHICA JB, 1986, IBM J RES DEV, V30

[6] VACUUM TUNNELING - A NEW TECHNIQUE FOR MICROSCOPY [J].

QUATE, CF .

PHYSICS TODAY, 1986, 39 (08) :26-33

[7]

SMITH DPE, 1986, REV SCI INSTRUM, V57

[8]

TEAGUE EC, 1982, WEAR, V75, P423

[9] POINT-CONTACT SPECTROSCOPY OF ELECTRON-PHONON INTERACTION IN NORMAL-METAL SINGLE-CRYSTALS [J].

YANSON, IK ;

KULIK, IO ;

BATRAK, AG .

JOURNAL OF LOW TEMPERATURE PHYSICS, 1981, 42 (5-6) :527-556

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