THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD

被引：121

作者：

GOLOVCHENKO, JA

机构：

[1] AT&T Bell Laboratories, Murray Hill, NJ 07974, United States

来源：

SCIENCE | 1986年 / 232卷 / 4746期

关键词：

CRYSTALS - Microscopic Examination - PHYSICS - Atomic - PIEZOELECTRIC DEVICES - SILICON AND ALLOYS - Microscopic Examination - TUNGSTEN AND ALLOYS;

D O I：

10.1126/science.232.4746.48

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

A new instrument called the tunneling microscope has recently been developed that is capable of generating real-space images of surfaces showing atomic structure. These images offer a new view of matter on an atomic scale. The current capabilities and limitations and the physics involved in the technique are discussed along with specific results from a study of silicon crystal surfaces.

引用

页码：48 / 53

页数：6

共 34 条

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