TUNNELING IMAGES OF ATOMIC STEPS ON THE SI(111)7X7 SURFACE

[1] SURFACE PROCESSES IN GROWTH SILICON ON (111)SILICON IN ULTRAHIGH VACUUM [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) : 4673 - &

[2] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[3] BINNIG G, 1985, SURF SCI, V152, P18

[4] KRUGER S, 1980, SURFACE SCI, V99, P157

[5] TESTS OF SI(111)-7X7 STRUCTURAL MODELS BY COMPARISON WITH TRANSMISSION ELECTRON-DIFFRACTION PATTERNS [J]. SURFACE SCIENCE, 1984, 147 (2-3) : 385 - 395

[6] SURFACE STACKING-SEQUENCE AND (7 X 7) RECONSTRUCTION AT SI(111) SURFACES [J]. PHYSICAL REVIEW B, 1983, 28 (04): : 2305 - 2307

[7] STRUCTURE OF SI(111)-7X7 .2. [J]. SURFACE SCIENCE, 1984, 147 (2-3) : 663 - 684

[8] MCRAE EG, 1984, STRUCTURE SURFACES, V2, P278

[9] SURFACE DISLOCATION PROCESS FOR SURFACE RECONSTRUCTION AND ITS APPLICATION TO THE SILICON (111) 7X7 RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (03) : 199 - 202

[10] PHOTOEMISSION MEASUREMENTS OF STEP-DEPENDENT SURFACE STATES ON CLEAVED SILICON [J]. PHYSICAL REVIEW LETTERS, 1975, 34 (14) : 874 - 877

[1] SURFACE PROCESSES IN GROWTH SILICON ON (111)SILICON IN ULTRAHIGH VACUUM [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) : 4673 - &

[2] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[3] BINNIG G, 1985, SURF SCI, V152, P18

[4] KRUGER S, 1980, SURFACE SCI, V99, P157

[5] TESTS OF SI(111)-7X7 STRUCTURAL MODELS BY COMPARISON WITH TRANSMISSION ELECTRON-DIFFRACTION PATTERNS [J]. SURFACE SCIENCE, 1984, 147 (2-3) : 385 - 395

[6] SURFACE STACKING-SEQUENCE AND (7 X 7) RECONSTRUCTION AT SI(111) SURFACES [J]. PHYSICAL REVIEW B, 1983, 28 (04): : 2305 - 2307

[7] STRUCTURE OF SI(111)-7X7 .2. [J]. SURFACE SCIENCE, 1984, 147 (2-3) : 663 - 684

[8] MCRAE EG, 1984, STRUCTURE SURFACES, V2, P278

[9] SURFACE DISLOCATION PROCESS FOR SURFACE RECONSTRUCTION AND ITS APPLICATION TO THE SILICON (111) 7X7 RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (03) : 199 - 202

[10] PHOTOEMISSION MEASUREMENTS OF STEP-DEPENDENT SURFACE STATES ON CLEAVED SILICON [J]. PHYSICAL REVIEW LETTERS, 1975, 34 (14) : 874 - 877