ULTRA-HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS MATERIALS AT 120-KV

被引：27

作者：

SMITH, DJ

STOBBS, WM

SAXTON, WO

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1981年 / 43卷 / 05期

关键词：

D O I：

10.1080/01418638108222356

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：907 / 923

页数：17

共 22 条

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[6] HOCH H, 1977, OPTIK, V47, P65
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[8] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS
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[J]. MICRON, 1979, 10 (02) : 101 - 115
[10] ORIGIN OF FRINGE STRUCTURE OBSERVED IN HIGH-RESOLUTION BRIGHT-FIELD ELECTRON-MICROGRAPHS OF AMORPHOUS MATERIALS
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