HIGH-RESOLUTION X-RAY-DIFFRACTION TOPOGRAPHY USING KBETA RADIATION

[1] CARLSON KA, 1961, J APPL PHYS, V32, P125

[2] CLARK GL, 1963, ENCYCLOPEDIA XRAY ED, P1053

[3] HOWARD JK, 1965, ADVANCES XRAY ANALYS, P35

[4] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[5] LANG AR, 1963, ENCY XRAYS GAMMA RAY, P1053

[6] NEWKIRK JB, 1962, DIRECT OBSERVATIO ED, P67

[7] DIRECT OBSERVATION OF IMPERFECTIONS IN SEMICONDUCTOR CRYSTALS BY ANOMALOUS TRANSMISSION OF X RAYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (09) : 2760 - &

[8] WEBB WW, 1962, DIRECT OBSERVATION I, P67

[9] Relative intensities and transition probabilities of the K-series lines of the elements 24 to 52 by the ionization chamber method [J]. PHYSICAL REVIEW, 1933, 44 (03): : 146 - 154

[1] CARLSON KA, 1961, J APPL PHYS, V32, P125

[2] CLARK GL, 1963, ENCYCLOPEDIA XRAY ED, P1053

[3] HOWARD JK, 1965, ADVANCES XRAY ANALYS, P35

[4] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[5] LANG AR, 1963, ENCY XRAYS GAMMA RAY, P1053

[6] NEWKIRK JB, 1962, DIRECT OBSERVATIO ED, P67

[7] DIRECT OBSERVATION OF IMPERFECTIONS IN SEMICONDUCTOR CRYSTALS BY ANOMALOUS TRANSMISSION OF X RAYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (09) : 2760 - &

[8] WEBB WW, 1962, DIRECT OBSERVATION I, P67

[9] Relative intensities and transition probabilities of the K-series lines of the elements 24 to 52 by the ionization chamber method [J]. PHYSICAL REVIEW, 1933, 44 (03): : 146 - 154