LONG-PATH MONITORING - ADVANCED INSTRUMENTATION WITH A TUNABLE DIODE-LASER

被引：39

作者：

HINKLEY, ED

KU, RT

NILL, KW

BUTLER, JF

机构：

[1] MIT LINCOLN LAB,LEXINGTON,MA 02173

[2] LASER ANAL INC,LEXINGTON,MA 02173

来源：

APPLIED OPTICS | 1976年 / 15卷 / 07期

关键词：

D O I：

10.1364/AO.15.001653

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1653 / 1655

页数：3

共 11 条

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