LUMINESCENCE AND PARTICLE-SIZE IN MICROCRYSTALLINE CDTE THIN-FILMS

被引：13

作者：

MENDOZAALVAREZ, JG ^{[1
]}

GONZALEZHERNANDEZ, J ^{[1
]}

SANCHEZSINENCIO, F ^{[1
]}

ZELAYA, O ^{[1
]}

机构：

[1] ENERGY CONVERS DEVICES INC,TROY,MI 48084

来源：

JOURNAL OF CRYSTAL GROWTH | 1988年 / 86卷 / 1-4期

关键词：

MICROCRYSTALS;

D O I：

10.1016/0022-0248(90)90749-B

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：391 / 395

页数：5

共 12 条

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POLLAK, FH .

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[2]

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MYERS, TH ;

SCHETZINA, JF .

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[4] INFLUENCE OF CD VACANCIES ON THE PHOTOLUMINESCENCE OF CDTE [J].

FIGUEROA, JM ;

SANCHEZSINENCIO, F ;

MENDOZAALVAREZ, JG ;

ZELAYA, O ;

VAZQUEZLOPEZ, C ;

HELMAN, JS .

JOURNAL OF APPLIED PHYSICS, 1986, 60 (01) :452-454

[5] RAMAN, TRANSMISSION ELECTRON-MICROSCOPY, AND CONDUCTIVITY MEASUREMENTS IN MOLECULAR-BEAM DEPOSITED MICROCRYSTALLINE SI AND GE - A COMPARATIVE-STUDY [J].

GONZALEZHERNANDEZ, J ;

AZARBAYEJANI, GH ;

TSU, R ;

POLLAK, FH .

APPLIED PHYSICS LETTERS, 1985, 47 (12) :1350-1352

[6] ROLE OF DEFECTS IN DETERMINING ELECTRICAL PROPERTIES OF CDS THIN-FILMS .1. GRAIN-BOUNDARIES AND SURFACES [J].

KAZMERSKI, LL ;

ALLEN, CW ;

BERRY, WB .

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[7]

KRAKOW W, 1984, MATER RES SOC S P, V31

[8]

Martynov V. N., 1979, Soviet Physics - Crystallography, V24, P737

[9]

Mendoza-Alvarez J. G., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V794, P38, DOI 10.1117/12.940889

[10]

MENEZES C, 1985, J ELECTROCHEM SOC, V132, P706

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