BACKGROUND REDUCTION IN D(HE-3-ALPHA)H DEPTH PROFILING EXPERIMENTS USING A SIMPLE ELECTROSTATIC DEFLECTOR

被引：7

作者：

MOLLER, W ^{[1
]}

机构：

[1] AARHUS UNIV,INST PHYS,DK-8000 AARHUS C,DENMARK

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 157卷 / 02期

关键词：

D O I：

10.1016/0029-554X(78)90295-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：223 / 227

页数：5

共 10 条

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[9] LARGE DEPTH PROFILE MEASUREMENTS OF D, HE-3, AND LI-6 BY DEUTERON INDUCED NUCLEAR-REACTIONS [J].

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[10] DEPTH PROFILING OF LIGHT-ELEMENTS IN MATERIALS WITH HIGH-ENERGY ION-BEAMS [J].

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