CHARGING EFFECT IN ELECTRON-IRRADIATED ICE

被引：23

作者：

FUCHS, W

BROMBACH, JD

TROSCH, W

机构：

来源：

JOURNAL OF MICROSCOPY | 1978年 / 112卷 / JAN期

关键词：

D O I：

10.1111/j.1365-2818.1978.tb01154.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：63 / 74

页数：12

共 22 条

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GROSS, B .

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[20]

SPIVAK GV, 1972, 5 P EUR REG C EL MIC, P492

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