EFFECT OF TEXTURIZED GLASS ON THE LIGHT TRAPPING IN THIN-FILM ELECTROLUMINESCENT DEVICES

被引:3
作者
VANDENBOSSCHE, J
DEVISSCHERE, P
NEYTS, KA
CORLATAN, D
机构
[1] Department of Electronics and Information Systems, University of Gent
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1994年 / 143卷 / 02期
关键词
D O I
10.1002/pssa.2211430218
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Most of the light generated in thin film electroluminescent devices is trapped in the thin film structure. By depositing the electroluminescent layer on a texturised substrate, light guiding is drastically reduced. This leads to a considerable enhancement of the total emitted flux. Due to the texture, the light intensity distribution deviates from the Lambert distribution. The influence of the geometry of the texture on the efficiency, the total emitted flux, and the light intensity distribution is investigated.
引用
收藏
页码:341 / 352
页数:12
相关论文
共 11 条
[1]  
ABELES F, 1971, PHYS THIN FILMS, V6, P151
[2]   EXCITATION EFFICIENCY IN THIN-FILM ELECTROLUMINESCENT DEVICES - PROBE LAYER MEASUREMENTS [J].
BENOIT, J ;
BARTHOU, C ;
BENALLOUL, P .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (03) :1435-1442
[3]  
BENOIT J, 1989, 4TH P INT WORKSH EL, V38
[4]  
KING CN, 1985, SID SEMINAR LECTURES
[5]   EFFICIENCY AND SATURATION IN AC THIN-FILM EL STRUCTURES [J].
MACH, R ;
MULLER, GO .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 81 (02) :609-623
[6]  
MACH R, 1990, ACTA POLYTECH SCAND, V170, P161
[7]  
MARELLO V, 1981, J APPL PHYS, V53, P3590
[8]   BASICS OF ELECTRON-IMPACT-EXCITED LUMINESCENCE DEVICES [J].
MULLER, GO .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 81 (02) :597-608
[9]   HOW TO MEASURE AND INTERPRET THE CONDUCTION CURRENT IN AC THIN-FILM ELECTROLUMINESCENT DEVICES [J].
NEYTS, KA ;
DEVISSCHERE, P .
SOLID-STATE ELECTRONICS, 1992, 35 (07) :933-936
[10]   AC THIN-FILM ELECTROLUMINESCENCE, FILAMENTARY EMISSION AND ITS MEMORY EFFECT [J].
RUHLE, W ;
MARRELLO, V ;
ONTON, A .
JOURNAL OF LUMINESCENCE, 1979, 18-9 (JAN) :729-738