HOW TO MEASURE AND INTERPRET THE CONDUCTION CURRENT IN AC THIN-FILM ELECTROLUMINESCENT DEVICES

被引：16

作者：

NEYTS, KA

DEVISSCHERE, P

机构：

[1] Laboratorium voor Elektronika en Meettechniek, Universiteit Gent, B-9000 Gent

来源：

SOLID-STATE ELECTRONICS | 1992年 / 35卷 / 07期

关键词：

D O I：

10.1016/0038-1101(92)90321-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we derive a general formula for the current supplied to a thin-film electroluminescent device, with a variable applied voltage and moving charges in the semiconductor layer. This formula results in an equivalent electrical network, with a current source representing the average current in the phosphor layer. We show how this current can be measured accurately by using a bridge measurement technique.

引用

页码：933 / 936

页数：4

共 13 条

[1]

CHEN YS, 1972, J APPL PHYS, V43, P4089, DOI 10.1063/1.1660878

[2] THE VALIDITY OF RAMOS THEOREM [J].