SCATTERING OF CONDUCTION ELECTRONS BY SURFACE-ROUGHNESS IN THIN METAL-FILMS

被引：32

作者：

KASER, A

GERLACH, E

机构：

[1] VI. Physikalisches Institut, RWTH-Aachen, Aachen

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1995年 / 97卷 / 01期

关键词：

D O I：

10.1007/BF01317598

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A fluctuation transport theory is applied to describe the extra resistivity of thin metal films due to electron scattering at rough surfaces. This scattering mechanism is described in terms of the surface profile autocorrelation. If the lateral extension of the surface structures exceeds the Fermi wavelength, the scattering can be described by a step density of terrace edges.

引用

页码：139 / 146

页数：8

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