COPPER CLUSTER IONS IN PHOTON-INDUCED FIELD-IONIZATION MASS-SPECTRA

被引：8

作者：

JENTSCH, T

DRACHSEL, W

BLOCK, JH

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1981年 / 38卷 / 2-3期

关键词：

D O I：

10.1016/0020-7381(81)80068-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：215 / 222

页数：8

共 20 条

[1] MASS SPECTROMETRIC ANALYSIS OF LOW TEMPERATURE FIELD EVAPORATION
BAROFSKY, DF
MULLER, EW
[J]. SURFACE SCIENCE, 1968, 10 (02) : 177 - &
[2] SIGNAL SHAPES OBSERVED IN PHOTON-INDUCED FIELD-IONIZATION MASS-SPECTRA
BLOCK, JH
JENTSCH, T
DRACHSEL, W
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 38 (2-3): : 195 - 213
[3] IONS SPUTTERED FROM COPPER
BRADLEY, RC
RUEDL, E
[J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) : 880 - &
[4] A REVIEW OF THE APPLICATIONS TO SOLIDS OF THE LASER ION-SOURCE IN MASS-SPECTROMETRY
CONZEMIUS, RJ
CAPELLEN, JM
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 197 - 271
[5] PHOTON-INDUCED FIELD-IONIZATION MASS-SPECTROSCOPY
DRACHSEL, W
NISHIGAKI, S
BLOCK, JH
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 32 (04): : 333 - 343
[6] FIELD-ION APPEARANCE SPECTROSCOPY - INVESTIGATIONS ON ION GENERATING PROCESSES AT FIELD EMITTER SURFACES
ERNST, N
BOZDECH, G
BLOCK, JH
[J]. SURFACE SCIENCE, 1979, 80 (01) : 645 - 655
[7] FRANZEN J, 1961, Z NATURFORSCH PT A, V16, P535
[8] LASER-INDUCED CLUSTER-IONS FROM THIN FOILS OF METALS AND SEMICONDUCTORS
FURSTENAU, N
HILLENKAMP, F
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (02): : 135 - 151
[9] FURSTENAU N, 1980, P S SPUTTERING, P707
[10] HIGH-SENSITIVITY LASER MICROPROBE MASS ANALYZER
HILLENKAMP, F
UNSOLD, E
KAUFMANN, R
NITSCHE, R
[J]. APPLIED PHYSICS, 1975, 8 (04): : 341 - 348