POLARIZATION MODULATION FT-IR SPECTROSCOPY OF SURFACES AND ULTRA-THIN FILMS - EXPERIMENTAL PROCEDURE AND QUANTITATIVE-ANALYSIS

被引：283

作者：

BUFFETEAU, T ^{[1
]}

DESBAT, B ^{[1
]}

TURLET, JM ^{[1
]}

机构：

[1] UNIV BORDEAUX 1,CTR PHYS MOLEC OPT & HERTZIENNE,CNRS,URA 283,F-33405 TALENCE,FRANCE

来源：

APPLIED SPECTROSCOPY | 1991年 / 45卷 / 03期

关键词：

INFRARED SPECTROSCOPY; POLARIZATION MODULATION; SURFACES; LB AND ULTRA-THIN FILMS;

D O I：

10.1366/0003702914337308

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Polarization modulation of the incident electromagnetic field is used to increase the sensitivity and the in situ experiment ability of the well-known method of reflexion absorption FT-IR spectroscopy, for the characterization of surfaces and ultra-thin films. The experimental procedure and signal processing of the detected intensity are described and illustrated with the use of results obtained with Langmuir-Blodgett monolayers. The quantitative analysis of the spectra is then developed, and a linear behavior of the band intensities is found for ultra-thin films exhibiting no strong absorptions. This result is checked with the use of organic and inorganic ultra-thin films of increasing thicknesses.

引用

页码：380 / 389

页数：10

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