共 11 条
[2]
EKSTROM HC, 1967, J OPT SOC AM, V57, P1132
[7]
HARRICK NJ, 1967, INTERNAL REFLECTION, P100
[8]
MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY
[J].
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY,
1963, A 67 (04)
:363-+
[10]
ZAININGER KH, 1964, RCA REV, V25, P85