MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY

被引:612
作者
MCCRACKIN, FL
PASSAGLIA, E
STROMBERG, RR
STEINBERG, HL
机构
来源
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1963年 / A 67卷 / 04期
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D O I
10.6028/jres.067A.040
中图分类号
O6 [化学];
学科分类号
0703 ;
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页码:363 / +
页数:1
相关论文
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