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EFFECT OF DIVERGENCE AND RECEIVING SLIT DIMENSIONS ON PEAK PROFILE PARAMETERS IN RIETVELD ANALYSIS OF X-RAY DIFFRACTOMETER DATA

被引：12
作者：
MADSEN, IC
HILL, RJ
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷 / 05期
关键词：
D O I：
10.1107/S0021889888003474
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：398 / 405
页数：8
相关论文
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