EFFECT OF DIVERGENCE AND RECEIVING SLIT DIMENSIONS ON PEAK PROFILE PARAMETERS IN RIETVELD ANALYSIS OF X-RAY DIFFRACTOMETER DATA

被引：12

作者：

MADSEN, IC

HILL, RJ

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷 / 05期

关键词：

D O I：

10.1107/S0021889888003474

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：398 / 405

页数：8

相关论文

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