QUANTITATIVE-ANALYSIS BY PROTON-INDUCED X-RAY-EMISSION UTILIZING AN INEXPENSIVE EXTERNAL-BEAM SYSTEM

被引：29

作者：

BAUMAN, SE ^{[1
]}

WILLIAMS, ET ^{[1
]}

FINSTON, HL ^{[1
]}

BOND, AH ^{[1
]}

LESSER, PMS ^{[1
]}

机构：

[1] CUNY BROOKLYN COLL,DEPT PHYS,BROOKLYN,NY 11210

来源：

NUCLEAR INSTRUMENTS & METHODS | 1979年 / 165卷 / 01期

关键词：

D O I：

10.1016/0029-554X(79)90307-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe a sensitive and convenient system for PIXE analysis in which an external beam impinges on samples in a helium-filled target chamber. Samples are presented to the beam by an ordinary slide projector, slightly modified, which can accommodate 80 slides. The numerous advantages of the system are enumerated. The sensitivity and range of detectable elements are the same as for PIXE systems employing the more usual vacuum chamber; absorption of low-energy X-rays in the helium is insignificant compared to absorption in the beryllium window of standard Si(Li) detectors. © 1979.

引用

页码：57 / 62

页数：6

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