DIFFUSION OF POINT-DEFECTS IN SILICON-CRYSTALS DURING MELT-GROWTH .2. ONE DIFFUSER MODEL

被引:30
作者
HABU, R
KOJIMA, K
HARADA, H
TOMIURA, A
机构
[1] NSC ELECTRON CORP,DEPT MFG,CRYSTAL GROWTH TECH GRP,YAMAGUCHI 743,JAPAN
[2] NIPPON STEEL CORP LTD,BUR TECH DEV,CHIBA 29912,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 04期
关键词
CZ-CRYSTAL; SILICON SINGLE CRYSTAL; GROWN-IN CRYSTAL DEFECT; OSF-RING; AGGLOMERATION OF POINT DEFECTS; DIFFUSION OF POINT DEFECTS; SELF INTERSTITIAL; VACANCY; PHENOMENOLOGICAL DIFFUSION EQUATION;
D O I
10.1143/JJAP.32.1747
中图分类号
O59 [应用物理学];
学科分类号
摘要
We introduce the phenomenological equations which describe the diffusion of one species of point defects in silicon single crystals during melt-growth. The chemical potential of point defects frozen into the crystal during CZ crystal growth is estimated, and the formation mechanism of the OSF-ring in CZ crystal is discussed with the equations thus developed. It was shown that the phenomenological diffusion equations can explain well the dependence of the location of the OSF-ring in CZ-crystals on crystal growth rate, and disappearance of the OSF-ring at low growth rate. The OSF-ring is proposed to be generated at the peak of the chemical potential of point defects frozen into the crystal.
引用
收藏
页码:1747 / 1753
页数:7
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