THE POSSIBILITIES FOR ANALYTICAL METHODS IN PHOTOEMISSION AND LOW-ENERGY MICROSCOPY

被引：40

作者：

BAUER, E

机构：

[1] Physikalisches Institut, Technische Universität Clausthal-Zellerfeld

来源：

ULTRAMICROSCOPY | 1991年 / 36卷 / 1-3期

关键词：

D O I：

10.1016/0304-3991(91)90137-U

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The possibilities of non-scanning imaging with X-ray-induced photoelectrons and with X-ray- or electron-induced Auger electrons are discussed from the point of view of the illumination source, the imaging system and the emission process.

引用

页码：52 / 62

页数：11

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