STUDY OF THE PHOTODECAY IN CDTE X-RAY-DETECTORS

被引：4

作者：

WURM, P ^{[1
]}

HAGEALI, M ^{[1
]}

KOEBEL, JM ^{[1
]}

SIFFERT, P ^{[1
]}

机构：

[1] LAB PHASE,CNRS,UPR 292,F-67037 STRASBOURG 2,FRANCE

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1994年 / 28卷 / 1-3期

关键词：

CADMIUM TELLURIDE; X-RAY; NUCLEAR DETECTOR; AFTER GLOW;

D O I：

10.1016/0921-5107(94)90013-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-resistivity cadmium telluride material and devices serving as X-ray detectors in industrial and medical equipment, such as the high-resolution tomograph, must meet specific requirements, among which sensitivity and rapidity of the photodecay are of great interest. Room temperature measurements of these parameters have been performed with a fast electronic set-up on a large variety of CdTe samples. The results show that the initial dopant is not a determining parameter for the rapidity of the decay. However, modification of the structure and the contacts of the samples can give very encouraging results.

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页码：47 / 50

页数：4

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