The mobility of a 250 angstrom spacer 2DEG structure has been improved by optimizing a number of MBE growth conditions. The effects of impurities from the Si dopant cell, the GaAs-AlGaAs interface growth temperature, the aluminium source and machine preconditioning have been examined. Under optimum growth conditions 4 K mobilities > 3.0 X 10(6) cm2 V-1 s-1 are achieved consistently.