EPITAXIAL QUALITY OF C-AXIS AND A-AXIS ORIENTED YBA2CU3O7 FILMS CHARACTERIZATION BY RAMAN-SPECTROSCOPY

被引：47

作者：

DIECKMANN, N ^{[1
]}

KURSTEN, R ^{[1
]}

LOHNDORF, M ^{[1
]}

BOCK, A ^{[1
]}

机构：

[1] UNIV HAMBURG,MIKROSTRUKTURFORSCH ZENTRUM,JUNGIUSSTR 11,D-20355 HAMBURG,GERMANY

来源：

PHYSICA C | 1995年 / 245卷 / 3-4期

关键词：

D O I：

10.1016/0921-4534(95)00116-6

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a model that describes the epitaxial quality of YBa2Cu3O7 films by three parameters - the c-axis oriented fraction of the film, its degree of in-plane orientation and the degree of in-plane orientation of the remaining a-axis oriented fraction. These parameters can be specified by the relative phonon intensities in polarized Raman spectra. We have determined the epitaxy parameters of a-axis and c-axis oriented laser-deposited YBa2Cu3O7 films on MgO (100) substrates. The accuracy of these parameters has been tested by performing Raman measurements at various rotation angles. The ratio of the intensities of the B-2g and B-3g modes observed on the a-axis oriented film indicates that a-axis growth is preferred to b-axis growth.

引用

页码：212 / 218

页数：7

共 23 条

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