THE INFLUENCE OF GROWTH TEMPERATURE ON THE STRUCTURAL CHARACTERISTICS OF YBA2CU3O7-DELTA FILMS - A RAMAN-SCATTERING STUDY

被引：7

作者：

BELOUSOV, MV

DAVYDOV, VY

SHERMAN, AB

机构：

[1] AF Ioffe Phys. Tech. Inst., St Petersburg

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1993年 / 6卷 / 12期

关键词：

D O I：

10.1088/0953-2048/6/12/003

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Orientation of YBa2Cu3O7-delta films at the surface and at the film-(100) MgO substrate interface for various growth temperatures T(s) have been studied using Raman scattering. On the film-substrate interface the films were c-oriented for T(s) > 670-degrees-C and a-oriented for lower growth temperatures. Films grown at T(s) almost-equal-to 670-degrees-C to a thickness > 0.2 mum contained a transition from the c-to the a-orientation near the surface. A possible mechanism for the influence of growth temperature on the YBa2Cu3O7-delta film orientation is discussed.

引用

页码：819 / 821

页数：3

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