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A SPECTROMETER FOR X-RAY ENERGY-DISPERSIVE DIFFRACTION USING SYNCHROTRON RADIATION

被引：36
作者：
OLSEN, JS
BURAS, B
GERWARD, L
STEENSTRUP, S
机构：
[1] ALSO RISO NATL LAB,DK-4000 ROSKILDE,DENMARK
[2] TECH UNIV DENMARK,APPL PHYS LAB 3,DK-2800 LYNGBY,DENMARK
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 10期
关键词：
D O I：
10.1088/0022-3735/14/10/015
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1154 / 1158
页数：5
相关论文
共 5 条
[1]   ON THE USE OF WIDE-ANGLE ENERGY-SENSITIVE DETECTORS IN WHITE-BEAM X-RAY SINGLE-CRYSTAL DIFFRACTION [J].
BURAS, B ;
OLSEN, JS ;
GERWARD, L .
NUCLEAR INSTRUMENTS & METHODS, 1980, 178 (01) :131-135
[2]  
BURAS B, 1980, 1979 P INT SEM ROM, P79
[3]   X-RAY INTENSITY MEASUREMENTS ON LARGE CRYSTALS BY ENERGY-DISPERSIVE DIFFRACTOMETRY .1. ENERGY DEPENDENCES OF DIFFRACTION INTENSITIES NEAR ABSORPTION-EDGE [J].
FUKAMACHI, T ;
HOSOYA, S ;
OKUNUKI, M .
ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (JAN1) :104-109
[4]  
LAINE E, 1980, J MATER SCI, V15, P269, DOI 10.1007/BF02396775
[5]  
OLSEN JS, 1979, EUROPEAN SYNCHROT S3
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