SINUSOIDAL PHASE MODULATING FIZEAU INTERFEROMETER

被引:16
作者
SASAKI, O
OKAMURA, T
NAKAMURA, T
机构
[1] Niigata University, Faculty of Engineering, Niigata-shi, 8050
来源
APPLIED OPTICS | 1990年 / 29卷 / 04期
关键词
D O I
10.1364/AO.29.000512
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Sinusoidal phase modulating interferometry is possible with Fizeau interferometers. The sinusoidal phase modulation is easily produced by vibrating the reference plate glass in a Fizeau interferometer. Since we can measure the amplitude and phase of the phase modulation with the interferometer itself, the exact phase modulation is obtained. The usefulness of the sinusoidal phase modulating Fizeau interferometer is made clear through surface profile measurements of 80-mm diam plate glasses and integrated circuit wafers and movement measurements of integrated circuit wafers. © 1990 Optical Society of America.
引用
收藏
页码:512 / 515
页数:4
相关论文
共 4 条
[1]   HETERODYNE FIZEAU INTERFEROMETER FOR TESTING FLAT SURFACES [J].
BARNES, TH .
APPLIED OPTICS, 1987, 26 (14) :2804-2809
[2]   SINUSOIDAL PHASE MODULATING INTERFEROMETER USING OPTICAL FIBERS FOR DISPLACEMENT MEASUREMENT [J].
SASAKI, O ;
TAKAHASHI, K .
APPLIED OPTICS, 1988, 27 (19) :4139-4142
[3]   SINUSOIDAL PHASE MODULATING INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENT [J].
SASAKI, O ;
OKAZAKI, H .
APPLIED OPTICS, 1986, 25 (18) :3137-3140
[4]   SINUSOIDAL PHASE MODULATING INTERFEROMETER USING THE INTEGRATING-BUCKET METHOD [J].
SASAKI, O ;
OKAZAKI, H ;
SAKAI, M .
APPLIED OPTICS, 1987, 26 (06) :1089-1093