STATISTICAL-ANALYSIS OF ELECTRON CHANNELING MICROANALYTICAL DATA FOR THE DETERMINATION OF SITE OCCUPANCIES OF IMPURITIES

被引：63

作者：

ROSSOUW, CJ

TURNER, PS

WHITE, TJ

OCONNOR, AJ

机构：

[1] GRIFFITH UNIV,DIV SCI & TECHNOL,NATHAN,QLD 4111,AUSTRALIA

[2] UNIV QUEENSLAND,CTR ELECTRON MICROSCOPE,ST LUCIA,QLD 4067,AUSTRALIA

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1989年 / 60卷 / 05期

关键词：

D O I：

10.1080/09500838908206462

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：225 / 232

页数：8

共 24 条

[1] EFFECTS OF THERMAL DIFFUSE-SCATTERING AND SURFACE TILT ON DIFFRACTION AND CHANNELING OF FAST ELECTRONS IN CDTE [J].

ALLEN, LJ ;

ROSSOUW, CJ .

PHYSICAL REVIEW B, 1989, 39 (12) :8313-8321

[2]

BENTLEY J, 1986, 44TH P M EL MICR SOC, P704

[3] ATOMIC SITE AND SPECIES DETERMINATIONS USING CHANNELING AND RELATED EFFECTS IN ANALYTICAL ELECTRON-MICROSCOPY [J].

KRISHNAN, KM .

ULTRAMICROSCOPY, 1988, 24 (2-3) :125-141

[4]

KRISHNAN KM, 1985, ACTA CRYSTALLOGR, V10, P219

[5] NON-ZERO-TH-ORDER LAUE ZONE EFFECTS AND ALCHEMI [J].

LYNCH, D ;

ROSSOUW, C .

ULTRAMICROSCOPY, 1987, 21 (01) :69-76

[6]

MCLAREN A, 1986, PHYS CHEM MINER, V14, P281

[7] THE DETERMINATION OF SITE OCCUPANCIES IN GARNET BY PLANAR AND AXIAL ALCHEMI [J].

OTTEN, MT ;

BUSECK, PR .

ULTRAMICROSCOPY, 1987, 23 (02) :151-158

[8] DELOCALIZATION CORRECTIONS FOR ELECTRON CHANNELING ANALYSIS [J].

PENNYCOOK, SJ .

ULTRAMICROSCOPY, 1988, 26 (1-2) :239-248

[9] ATOM LOCATION BY AXIAL-ELECTRON-CHANNELING ANALYSIS [J].

PENNYCOOK, SJ ;

NARAYAN, J .

PHYSICAL REVIEW LETTERS, 1985, 54 (14) :1543-1546

[10]

PENNYCOOK SJ, 1987, SCANNING ELECTRON MI, V2, P21

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