WAVELET-BASED CORNER DETECTION

被引:34
作者
LEE, JS
SUN, YN
CHEN, CH
TSAI, CT
机构
[1] NATL CHENG KUNG UNIV,DEPT ELECT ENGN,TAINAN 70101,TAIWAN
[2] NATL CHENG KUNG UNIV,INST INFORMAT ENGN,TAINAN 70101,TAIWAN
关键词
WAVELET TRANSFORM; CORNER DETECTION; MULTISCALE; INTRINSIC RATIOS; EXTREMA LINE PATTERNS; MASKING ALGORITHM;
D O I
10.1016/0031-3203(93)90051-W
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A non-parametric algorithm for detecting and locating corners of planar curves is proposed. The algorithm is based on the multiscale wavelet transform of the orientation of the curve which can effectively utilize both the information of local extrema positions and magnitudes of the transform results. The corner candidates can then be selected easily based on this information. According to the angle preserving concept, intrinsic ratios of several corner models have been derived and used to evaluate the corner candidates. The corner angles can also be obtained during these processes. To make the evaluation process robust a masking algorithm is proposed. Experiments depict that our detector is more effective than the single scale comer detectors, while is more efficient than the multiscale comer detector by Rattarangsi and Chin (Proc. Int. Conf. Pattern Recognition, pp. 923-930 (1990)).
引用
收藏
页码:853 / 865
页数:13
相关论文
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