PREPARATION OF SELF-SUPPORTING ANODIC BARRIER FILMS ON ALUMINUM FOR BACKSCATTERING ANALYSIS

被引：9

作者：

SHIMIZU, K

SKELDON, P

THOMPSON, GE

WOOD, GC

机构：

来源：

关键词：

D O I：

10.1002/sia.740040507

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：208 / 211

页数：4

共 5 条

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[2] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS
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MAYER, JW
NICOLET, MA
BUCK, TM
AMSEL, G
EISEN, F
[J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41
[3] CHANNELING-EFFECT ANALYSIS OF THIN FILMS ON SILICON - ALUMINUM OXIDE
MITCHELL, IV
KAMOSHIDA, M
MAYER, JW
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) : 4378 - +
[4] NICLETT MA, 1972, SCIENCE, V177, P841
[5] SKELDON P, UNPUB SURF INTERFACE