MICROSTRUCTURAL INVESTIGATION OF ALPHA-BETA YTTRIUM SIALON MATERIALS

被引：49

作者：

CHATFIELD, C

EKSTROM, T

MIKUS, M

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1986年 / 21卷 / 07期

关键词：

D O I：

10.1007/BF01114271

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2297 / 2307

页数：11

共 27 条

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