INFLUENCE OF DEPOSITION PARAMETERS ON THE OPTICAL AND STRUCTURAL-PROPERTIES OF IIO2 FILMS PRODUCED BY REACTIVE DC PLASMATRON SPUTTERING

被引:108
作者
SCHILLER, S [1 ]
BEISTER, G [1 ]
SIEBER, W [1 ]
SCHIRMER, G [1 ]
HACKER, E [1 ]
机构
[1] UNIV JENA,PHYS SECT,DDR-69 JENA,GER DEM REP
关键词
D O I
10.1016/0040-6090(81)90673-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:239 / 245
页数:7
相关论文
共 7 条
[1]  
BIEDERMANN A, THIN SOLID FILMS
[2]   SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM [J].
MANIFACIER, JC ;
GASIOT, J ;
FILLARD, JP .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11) :1002-1004
[3]   REACTIVELY SPUTTERED OXIDE OPTICAL COATINGS FOR INERTIAL CONFINEMENT FUSION LASER COMPONENTS [J].
PAWLEWICZ, WT ;
BUSCH, R .
THIN SOLID FILMS, 1979, 63 (02) :251-256
[4]  
PAWLEWICZ WT, 1979, OCT P S OPT MAT HIGH
[5]  
Roy R., 1972, J CRYST GROWTH, V13-14, P78, DOI [10.1016/0022-0248(72)90066-8, DOI 10.1016/0022-0248(72)90066-8]
[6]  
SCHILLER S, 1981, VAKUUM-TECH, V30, P3
[7]   FEATURES OF AND INSITU MEASUREMENTS ON ABSORBING TIOX FILMS PRODUCED BY REACTIVE DC MAGNETRON-PLASMATRON SPUTTERING [J].
SCHILLER, S ;
BEISTER, G ;
SCHNEIDER, S ;
SIEBER, W .
THIN SOLID FILMS, 1980, 72 (03) :475-483