A NOVEL TECHNIQUE FOR MEASURING RESISTANCE FLUCTUATIONS INDEPENDENTLY OF BACKGROUND-NOISE

被引：32

作者：

VERBRUGGEN, AH

STOLL, H

HEECK, K

KOCH, RH

机构：

[1] MAX PLANCK INST MET RES,INST PHYS,D-7000 STUTTGART 80,FED REP GER

[2] FREE UNIV AMSTERDAM,NATUURKUNDIG,1081 HV AMSTERDAM,NETHERLANDS

[3] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 48卷 / 03期

关键词：

D O I：

10.1007/BF00619390

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：233 / 236

页数：4

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