SI-C-60-SI(111)-(7X7) INTERACTIONS - A SCANNING-TUNNELING-MICROSCOPY STUDY

被引:10
作者
CHEN, D [1 ]
CHEN, J [1 ]
SARID, D [1 ]
机构
[1] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721
基金
美国国家科学基金会;
关键词
CARBON; SILICON; TUNNELING;
D O I
10.1016/0039-6028(94)90039-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Scanning tunneling microscopy (STM) has been used to study the interaction of deposited silicon atoms with C-60 molecules adsorbed on Si(111)-(7x7) surfaces. Zn spite of the known strong bonding of C-60 molecules to the silicon surfaces, we find the unexpected result of lack of bonding of the deposited silicon atoms to the adsorbed C-60 molecules, at temperatures up to 600 degrees C. The strong C-60-substrate interaction is revealed from the excessive substrate surface strain induced by the C-60 adsorbates, which creates a variety of metastable structures on the silicon surface.
引用
收藏
页码:190 / 194
页数:5
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