FIRST TEST OF THE SCANNING-X-RAY MICROPROBE WITH BRAGG-FRESNEL MULTILAYER LENS AT ESRF BEAM LINE

被引:22
作者
CHEVALLIER, P
DHEZ, P
LEGRAND, F
IDIR, M
SOULLIE, G
MIRONE, A
ERKO, A
SNIGIREV, A
SNIGIREVA, I
SUVOROV, A
FREUND, A
ENGSTROM, P
NIELSEN, JA
GRUBEL, A
机构
[1] UNIV PARIS 06,LPAN,F-75252 PARIS,FRANCE
[2] UNIV PARIS 11,LSAI,F-91405 ORSAY,FRANCE
[3] CEA,F-91680 BRUYERES CHATEL,FRANCE
[4] UNIV TRIESTE,CTR ADV RES SPACE OPT,DIPARTIMENTO ASTRON,TRIESTE 99,ITALY
[5] CNRS,CRISTALLOG LAB,F-38042 GRENOBLE,FRANCE
[6] RUSSIAN ACAD SCI,INST MICROELECTR TECHNOL,CHERNOGOLOVKA 142432,RUSSIA
[7] ESRF,GRENOBLE,FRANCE
关键词
D O I
10.1016/0168-9002(94)01052-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The fluorescence X-ray scanning 2D microprobe based on a Bragg-Fresnel multilayer lens (BFML) has been tested at the ESRF, Grenoble (France) for the first time. A single elliptical BFML has been used for two-dimensional focusing of the X-ray synchrotron beam of an undulator source in the energy range of 12 keV. A spatial resolution of 2.4 mu m and a photon intensity of about 10(10) photons per second have been measured using a Cr knife-edge test object.
引用
收藏
页码:584 / 587
页数:4
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