RELATION BETWEEN TC AND CU-O BOND LENGTH WITHIN THE BASAL-PLANE OF CE0.15ND1.85-XMXCUO4-Y (M=LA AND SM) AND CE0.15PR1.85CUO4-Y

被引：12

作者：

OHISHI, K

SYONO, Y

KIKUCHI, M

KOBAYASHI, N

MUTO, Y

机构：

[1] Institute for Materials Research, Tohoku University, Aoba-ku, Sendai, 980, Katahira

来源：

SOLID STATE COMMUNICATIONS | 1990年 / 73卷 / 05期

关键词：

D O I：

10.1016/0038-1098(90)90434-D

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

X-ray powder diffraction analysis, oxygen content and magnetic susceptibility measurements have been performed on reduced Ce0.15 Nd1.85-xMxCuO4-y (M=La and Sm) and Ce0.15Pr1.85CuO4-y with the Nd2CuO4 structure. Substitutions of Nd3+ by La3+ and Sm3+ were shown to keep the oxygen content constant, hence, the carrier concentration. Tc of the La-doped and Pr-samples monotonously decreased with increasing Cu-O bond length, while that of the Sm-doped samples did not change with decreasing the Cu-O bond length, consistent with the recent results on the pressure effect of Tc in Ce0.15Nd1.85CuO4-y. © 1990.

引用

页码：341 / 343

页数：3

共 10 条

[1] X-RAY-POWDER DIFFRACTION ANALYSIS OF THE ELECTRON SUPERCONDUCTOR ND2-XTHXCUO4 SYSTEM [J].