WET ETCHING OF THIN SNO2 FILMS

被引:3
作者
GUEORGUIEV, VK
POPOVA, LI
BESHKOV, GD
TOMAJOVA, NA
机构
[1] Institute of Solid State Physics, Bulgarian Academy of Sciences, 1784 Sofia
关键词
D O I
10.1016/0924-4247(90)80049-B
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The etching behaviour of thin SnO2 films on Si in hydroiodic acid is investigated. The etch rate depends linearly on the acid concentration in the range 22-55% and increases monotonically with the temperature up to 40 °C. A steep increase in observed for higher temperatures. The etching of SnO2 films in HI gives excellent pattern resolution and edge quality and is suitable for submicron-size realization. © 1990.
引用
收藏
页码:61 / 63
页数:3
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