PROCESS TEST CHIP FOR JOSEPHSON INTEGRATED-CIRCUITS

被引：4

作者：

KLEPNER, SP

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1981年 / 17卷 / 01期

关键词：

D O I：

10.1109/TMAG.1981.1060966

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：282 / 285

页数：4

共 20 条

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BASAVAIAH, S ;

GREINER, JH ;

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JOURNAL OF APPLIED PHYSICS, 1980, 51 (03) :1702-1710

[2]

CHANG W, 1980 APPL SUP C

[3]

CHANG WH, UNPUBLISHED

[4] EFFECT OF DISSOLVED GASES ON SOME SUPERCONDUCTING PROPERTIES OF NIOBIUM [J].

DESORBO, W .

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[5] STAND-ALONE WIRING PROGRAM FOR JOSEPHSON LOGIC [J].

DONATH, WE .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (04) :480-485

[6]

EPPERLEIN PW, COMMUNICATION

[7] DESIGN OF 2.5-MICROMETER JOSEPHSON CURRENT INJECTION LOGIC (CIL) [J].

GHEEWALA, TR .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (02) :130-142

[8]

GREINER J, UNPUBLISHED

[9] FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS [J].

GREINER, JH ;

KIRCHER, CJ ;

KLEPNER, SP ;

LAHIRI, SK ;

WARNECKE, AJ ;

BASAVAIAH, S ;

YEN, ET ;

BAKER, JM ;

BROSIOUS, PR ;

HUANG, HCW ;

MURAKAMI, M ;

AMES, I .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (02) :195-205

[10]

HEBARD AF, 1978, J APPL PHYS, V49, P339

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