DEPENDENCE OF EMISSION WAVELENGTH ON CAVITY LENGTH AND FACET REFLECTIVITIES IN MULTIPLE QUANTUM WELL SEMICONDUCTOR-LASERS

被引:6
作者
WILCOX, JZ
OU, S
YANG, JJ
JANSEN, M
PETERSON, GL
机构
关键词
D O I
10.1063/1.101156
中图分类号
O59 [应用物理学];
学科分类号
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页码:2174 / 2176
页数:3
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